OIS, Sterling sign agreement for sensor panels

17 Jun 2002

Optical Imaging Systems, Inc. (OIS) and Sterling Diagnostic Imaging have signed an agreement to provide thin film transistor sensor panels for Sterling's DirectRadiography advanced X-ray image capture technology. The OIS sensor panels for the basic readout structure for Sterling's X-ray detector array; during an X-rayexposure the electrical signal is generated and temporarily stored in a capacitor on each pixel and then accessed for electrical readout. The Direct Radiographytechnology directly captures and converts X-ray energy into electrical signals and is currently undergoing clinical evaluation.