The Phasics ultra-high-resolution wavefront sensor family is expanding!
11 Feb 2021
Phasics is the world leader and a pioneer in high-resolution wavefront sensing dedicated to beam testing and optics metrology. Based on its patented Quadri-Wave Lateral Shearing Interferometry (QWLSI) technology, all Phasics solutions benefit from the compactness and ease of use of a wavefront sensor, combined with the high resolution, precision, and sensitivity of an interferometer. Learn more about the numerous advantages of this unique technology here.
Following the recent release of our SID4-sC8 high-resolution wavefront sensor dedicated to material inspection and refractive index measurement, Phasics is proud to expand its ever-growing range of solutions with a new ultra-high-resolution sensor, the SID4-UHR. Combining a large aperture of 15x15 mm2 with Phasics high-resolution and high-sampling wavefront capabilities, the SID4-UHR is packed with everything you need for your next optics metrology challenge!
Unlimited wavefront metrology capabilities
With systems covering the UV, Visible, NIR, SWIR, MWIR and LWIR ranges, Phasics wavefront sensors are the easiest to integrate and the ultimate tools for demanding optics metrology challenges and beam qualification. Providing live Transmitted Wavefront Error (TWE), Reflected Wavefront Error (RWE), MTF, Zernike decomposition, WFE, beam parameters, and much more, Phasics range of instruments have everything to answer today’s optics metrology challenges: Free Space Optical Communication systems alignment, ADAS and AR/VR components qualification (LIDARs, metasurfaces, metalenses, waveguides, optical filters, assemblies, wide angle lenses with high chief ray angles, etc.).
A solution for any market
Phasics offers standalone wavefront sensors and expert software for integration with your own test bench but also modular automated systems for R&D and fully integrated machines ready for production. Discover our instruments for beam testing, optical systems alignment and metrology, quantitative phase imaging, and material inspection.