15 Jan 2008 High resolution USAF 1951 test charts with pattern detail down to the SUB MICRON level. Pyser-SGI now offers four competitively priced test charts with detail down to Group 9, Element 3. The test charts are available in positive or negative versions on either a square glass plate or microscope slide, to suit desired application.
FEATURES - Hi Resolution Sub-micron bar size as standard
- Positive or Negative image available
- PS75 Mounted in Stainless Steel microscope slide holder with engraved unique serial number (Groups 2 to 9*)
- R75 50mm square glass version includes additional groups 0 & 1
(*Smallest feature Group 9 Element 3 – see chart for details)
The PS75 USAF resolution chart is mounted in a stainless steel slide to reduce risk of breakage (common with all-glass slide constructed products). A unique serial number is engraved in the mount to give traceability, and is supplied in a polished wooden box.
The R75 square plate version is imaged on a glass plate measuring 50mm x 50mm. This larger plate also has Groups 0 and 1. USAF resolution charts are recognised the world over as a universal standard for testing the vertical and horizontal resolution of imaging systems. Each element on the chart comprises three vertical bars and three horizontal bars. The detail on this new slide is as fine as 0.78microns (644 line-pairs per mm). The resolution of the imaging system is normally specified as the Group and Element that is the finest that can be clearly defined, that is just before the black and white bars start to blur and blend together.
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