ficonTEC TestLine – Mixed-signal electro-optical measurements systems for integrated photonic devices
09 Jan 2020
TestLine production machines are fully-automated test systems for full LIV testing as well as for spectral and near/far-field beam characterization of single laser chips, VCSELs, unmounted laser diode bars, and chip-on-submount (CoS) sources. They are also available for a variety of other complex tasks, including singulated chip testing, automated optical inspection, and more. High-end models can be equipped with an optional wafer table for wafer-level testing tasks.
Stand-alone TestLine machines are designed to provide as much multi-functional test-&-qualify capability in a single cell format as possible – these machines are best suited to complex testing requirements requiring multiple steps within a single machine system. New, next-generation inline machine systems utilize a re-designed housing format and state-of-the-art feed-in/out capabilities in order to be production-(in)line-capable from the ground up. They can be supplied individually as a versatile tester cell designed to slot into an existing or proposed production line. Alternatively, they can be supplied in combination with additional AssemblyLine, BondLine and/or FiberLine systems as task-optimized production segments.
A more recent addition to TestLine capability is compatibility with PXI-based optical instrumentation modules that leverage National Instruments’ LabVIEW graphical programming environment, making integration seamless and enabling the creation of sophisticated and fully-automated, combined electro-optical test solutions to match individual requirements. A similar goal can also be achieved within non-LabVIEW and alternative instrumentation environments using modular bench-top and IOT-focused test equipment.
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