Ultra-Fast Surface and Wavefront Measurement

02 Jan 2013

The new µPhase® PRO Workshop interferometer measures surface and wavefront aberrations in a matter of seconds. The simple handling, the integrated alignment mode and the short measurement time create a device that is ideal for in line measurement of plane and spherical samples. Besides the visual fringe analysis a measurement and analysis software is available as an upgrade.

For more information visit the Trioptics website here. http://www.trioptics.com/