11 May 2009 CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the QDI 2010 Film™ microspectrophotometer. The QDI 2010 Film™ instrument is designed to measure the thickness of thin films of sub-micron sampling areas rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the QDI 2010 Film™ enables the user to determine thin film thickness on everything from semiconductors, MEMS devices, disk drives to flat panel displays. When combined with CRAIC Technologies proprietary contamination imaging capabilities, the QDI 2010 Film™ represents a major step forward in that it is designed specifically for industrial processes. |
