23 Apr 2009 We are proud to introduce the Phenom desktop SEM imaging tool from FEI company, which offers up to 24,000x magnification and an easy to use touch screen interface. The Phenom is perfectly suited to a broad range of applications and bridges the gap between optical and electron microscopy.
Featuring a breath-taking touch screen user interface that provides never lost navigation, Phenom provides high throughput with only 30 seconds to data and is extremely easy to use; Phenom user's go from novice to expert in a matter of minutes.
Its design ensures it can handle a wide range of samples with minimal preparation and samples are loaded instantly with Phenom's patented vacuum technology. High resolution electron and optical images are saved on a USB memory stick for off-line analysis, measurements and distribution.
The Phenom is now available for demonstration at our user facility in Harpenden, Hertfordshire, so contact us today for a demonstration. |
