06 Feb 2009 Fully-automated, total characterization of 1-12mm optics regardless of NA! BFL, EFL, chromatism, field curvature, distortion, vignetting, rel illumination, 3D MTF, MTF through-focus, best focal plane. Configurable to meet your needs, the SL-Sys™ neo is the solution for complete wavefront characterization of convergent (positive power) optical components 1-12 mm in diameter of any numerical aperture over the entire field of view. Designed for industrial R&D and production line quality control, the SL-Sys neo enables users to precisely measure the optical element’s aberrations as wavefront errors over the entire field of view and/or at any point therein.
Get detailsed information and watch a video demonstration of the SL-Sys neo at www.imagine-optic.com/neo |
