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Product Announcement

McPherson Vacuum Ultraviolet Optical Crystal Characterization System

07 May 2008

Measure optical & luminescence properties of optical crystals, films and single crystals in the VUV

McPherson, Inc. (Chelmsford, MA USA) under contract from the Solid State Physics Division of the Czech Republic Academy of Science delivered a Vacuum Ultraviolet (VUV) spectrometer system for transmission, reflection, and emission measurements. The system works with vacuum, from 120 to 930nm, and tunable, VUV sample excitation and emission. The cool detector has 5nsec time resolution. The Czech group, led by Dr. Martin Nikl, uses the McPherson spectrometer to measure and characterize optical and luminescence properties.

CONTACT DETAILS
McPherson
7-A Stuart Road
Chelmsford
MA
01824-4107
United States
Tel: 978 256 4512
Fax: 978 250 8625
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