07 May 2008 Measure optical & luminescence properties of optical crystals, films and single crystals in the VUV McPherson, Inc. (Chelmsford, MA USA) under contract from the Solid State Physics Division of the Czech Republic Academy of Science delivered a Vacuum Ultraviolet (VUV) spectrometer system for transmission, reflection, and emission measurements. The system works with vacuum, from 120 to 930nm, and tunable, VUV sample excitation and emission. The cool detector has 5nsec time resolution. The Czech group, led by Dr. Martin Nikl, uses the McPherson spectrometer to measure and characterize optical and luminescence properties. |