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Date Announced: 22 Sep 2014
Position Sensing Detectors (PSDs) are popular for applications such as Atomic Force Microscopy (AFM). This measurement technique is a form of high accuracy contact measurement where a probe which has a tiny contact area is dragged across the sample surface.
A beam deflection approach is used where a laser beam is deflected off the cantilever and a detector is used to measure the displacement of the beam. The displacement of the deflected laser spot is very small and for this reason the PSD‘s high resolution design (with some devices featuring a resolution of 2.5µm) and their nanosecond range response time makes them ideal for this application.
Thanks to the simplicity of design many users integrate PSDs into their own bespoke measurement systems.
For more information visit our website at
http://www.lasercomponents.com/uk/photodiodes/position-sensitive-detectors/
E-mail: info@lasercomponents.co.uk
Web Site: www.lasercomponents.co.uk
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