Optics.org
daily coverage of the optics & photonics industry and the markets that it serves
Featured Showcases
Photonex+Vacuum Technologies
News
Menu
LMU's set up for mapping defect densities in organic thin films.
Set up for mapping defect densities in organic thin films. A pulsed laser beam is used to raster-scan the material of interest, which is then assembled in a field-effect geometry, allowing changes in current flow to be detected. The yellow zones indicate sites at which the defect density is particularly high. (Image: Christian Westermeier).
Copyright © 2021 SPIE EuropeDesigned by Kestrel Web Services