This seminar is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the day will include an introduction to ellipsometry, fundamentals of ellipsometric data analysis, and an overview of ellipsometric applications in both research and production. New emerging applications will be highlighted.
As part of this workshop we will include a special session on the RC2 - the first spectroscopic ellipsometer with two rotating compensators. It combines the best features of previous instruments with innovative new technology: dual rotating compensator, achromatic compensator design, advanced light source, next-generation spectrometer design and extended spectral range to 2500 nm. The RC2 is a near-universal solution for the diverse applications of spectroscopic ellipsometry and Mueller matrix ellipsometry more >>
On the day we will have the entry level alpha-SE ellipsometer and demonstrate measurements and analysis procedures. Ellipsometry allows very sensitive measurement of film thickness, optical constants, composition, surface and interface roughness and many more more >>
There will be a complimentary lunch provided on the day as well as all day refreshments. Delegate places are strictly limited, so early registration is advised. The agenda will be finalised shortly.
