CLEO®/Europe will showcase the latest developments in a wide range of laser and photonics areas including laser source development, materials, ultrafast science, fibre optics, nonlinear optics, terahertz sources, high-field physics, optical telecommunications, nanophotonics, biophotonics and photonics for defense and security.
EQEC will feature the fundamentals of quantum optics, quantum information, atom optics, ultrafast optics, nonlinear phenomena and self-organization, plasmonics and metamaterials, fundamental nanooptics, theoretical and computational photonics.
This combination provides a unique forum to obtain informative overviews and discuss recent advances in a wide spectrum of topics, from fundamental light-matter interactions and new sources of coherent light to technology development, system engineering and applications in industry and applied science. Over five days CLEO®/Europe-EQEC 2015 will feature a large number of technical contributions in parallel sessions and posters drawn from industry, university and research organizations from around the world. Topics will cover a very wide spectrum of technical areas including laser development and new optical materials, nonlinear optics and nonlinear dynamics, ultrafast phenomena, telecommunications technologies, atom and quantum optics, quantum information precision metrology, fibre optics, sensing photonic crystals, nanophotonics and metamaterials etc. Particular highlights of the 2015 programme will be a series of special symposia that will survey recent advances in the emerging areas of Light Management in Photovoltaics, Photonic Lab-on-chip Biosensors, Laser Driven Acceleration, Optics in Graphene and Other Two-Dimensional Materials and Integrated Quantum Optics. Additionally a series of joint sessions organised in cooperation with collocated conferences will be organised. Announced topics are: Diagnostics and Control (LiM-CLEO®/Europe), Biophotonics: Systems and Applications (ECBO-CLEO®/Europe), and Computational Photonics for Metrology Applications (SPIE-Metrology-EQEC).
