Santec announces new Swept Photonics Analyzer - Model: SPA-110

11 Nov 2024

Santec Holdings Corporation, a leading manufacturer of advanced optical components, tunable lasers, optical test equipment, and OCT systems, announces the product launch of the extended range Swept Photonics Analyzer (SPA-110). The SPA-110, in conjunction with Santec’s market leading tunable laser, uses optical frequency domain reflectometry (OFDR) technology to analyze compact fiber optic and photonic devices for insertion loss and return loss with a spatial resolution of better than 5 μm.

The SPA-110 builds on Santec’s predecessor, the SPA-100, by extending the totalmeasurement range from 5 m to 30 m. This increased range accommodates the additionof optical signal conditioning devices, such as polarization controllers and opticalswitches, within the fiber optic setup. This enhancement makes the system particularlysuitable for more comprehensive characterization of small devices like silicon photoniccircuits, fiber optic components, and compact fiber optic assemblies.  Furthermore, the extended scan length allows for the analysis of longer fiber optic cable assemblies with closely spaced components, where OTDR technology might struggle to distinguish between them.

Finally, the 80 dB dynamic range during Wavelength Dependent Loss measurement (WDL)
make it possible to detect even weaker reflection events.

Features:

• 30 m measurement range makes it ideal for integration into photonics devices testing systems.
• High Spatial Resolution: <5 μm spatial resolution in silicon
• Wide Dynamic Range for WDL: better than 80 dB dynamic range for WDL measurements
• Auxiliary OPM port: Integrate external OPM to facilitate automated alignment to waveguide
• Configurable: O-band and CL band options
• Proximity sensing: Use OFDR technology to sense distance between fiber probe and wafer
• Easy Analysis: Intuitive software to analyze areas of interest, apply di􀆯erent refractive
  indexes to portions of the scan, measure IL and RL, store/load previous data for further
  analysis.

Click here to find out more.