06 Jul 2022 Photonic Science back-reflection Laue system allows real-time crystal orientation down to 0.1 degrees accuracy. The system delivers an intense X-ray beam with less than 0.3mm on sample. Single crystals electro-optical properties are strongly dependent on crystallographic orientations.
The LAUE tool collects a high-resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy.
The Laue Systems are customized for handling wafers, small batches of mm square samples, or larger samples such as 25kg ingots. We provide automated data collection from sample loading, and acquisition of diffraction patterns, down to individual sample report generation.
The system also copes with the indexation of complex grain structures as in the case of polycrystalline materials, thanks to combined modalities allowing both X-ray diffraction and extraction of weakly contrasted grain contours. | 
