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Beam Profiling Camera with GigE Interface for High-Speed Industrial Applications

25 Jan 2019

The Ophir® SP920G GigE Silicon CCD High Resolution Camera is designed for industrial laser beam profiling applications. Accurately captures and analyzes wavelengths from 190nm - 1100nm. Features a compact design, wide dynamic range, unparalleled signal to noise ratio, and high-speed GigE (Gigabit Ethernet) interface. Delivers 1624 x 1224 pixel resolution with a 4.4µm pixel pitch for measuring beam widths of 44μm - 5.3mm. Ideal for measuring CW and pulsed laser profiles in laser cutting of medical devices or welding of dissimilar materials

For more information click here or visit the team at Photonics West 5th - 7th Feb, San Francisco.  Booth 927

CONTACT DETAILS
Ophir
3050 North 300 West
North Logan
UT
84341
United States
Tel: 4357533729
Fax: 001 435 753 5231
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