06 Aug 2012 Photon etc. offers complex material analysis (GaAs, SiC, CdTe, CIS, CIGS) using hyperspectral imaging of diffuse reflectance, photoluminescence, electroluminescence and Raman signals. Our technology is based on high throughput global imaging filters, faster and more efficient than spectrograph based hyperspectral systems. Imaging from 400 to 1000 nm with a bandwidth of 2 nm, Photon etc’s IMA is capable of measuring opto-electrical properties such as Voltage Open Circuit and External Quantum Efficiency, and allows precise detection and characterization of defects in materials. Researchers and QC analysts will greatly benefit from this new innovation. |
