Optics.org
daily coverage of the optics & photonics industry and the markets that it serves
Featured Showcases
Photonics West Showcase
Laser World of Photonics Showcase
Products
Menu
Product Announcement

Nano-Indentation / Materials Testing with Scanning Probe Microscopy / Piezo Stages and Capacitive Sensors

06 Jul 2011

A particularly flexible nano-indentation system by Micro Materials Ltd. offers a large variety of methods for materials characterization, including nano-indentation, nano-impact and nano-scratch and wear measurements. It can measure penetration depths between 0.1 nanometers and 50 microns based on a PISeca capacitive gage by PI. A combined indentation / scanning probe microscope mode based on a piezo scanning stage provides a quick method for assessing the sample surface.

Read Technote:

For more information on the NanoTest system visit http://www.micromaterials.co.uk.

For more information on piezo nano-positioning systems http://www.nanopositioning.net

CONTACT DETAILS
PI (Physik Instrumente) L.P
440 Hartford Turnpike
Shrewsbury
MA
01545
United States
Tel: 508 832 3456
Fax: 508 832 0506
Email Us
Web Site
© 2025 SPIE Europe
Top of Page