14 Mar 2011 PI (Physik Instrumente) L.P. – a leading manufacturer of piezo nanopositioning systems and piezo scanners for microscopy, bio-medical and nanotechnology applications – has released a new catalog on planar piezo scanners for Atomic Force and Scanning Probe microscopy.
The new catalog covers a variety of novel closed-loop planar piezo scanners, and controllers with advanced digital features for higher scanning rates, improved linearity and responsiveness.
Compared to conventional piezo tube scanners, the low-bow, flexure guided piezo stages are run in closed-loop mode and provide significantly lower out of plane motion (flatness) and better linearity. A special stage designed with a new lead-free piezo material allows resolution down to 20 picometers and less than 1 nanometer hysteresis.
Flexure stages with travel ranges to 1800 microns are available and many different configurations from single axis to 6-axis systems are offered.
Self-locking ultrasonic motor stages with long travel ranges to 200mm are also available for pre-positioning, and as a stable base for the high-speed piezo scanners.
The Piezo Scanner Catalog can be downloaded here.
http://www.piezo.ws/pdf/Catalog_AFM_Planar_Piezo_Stage_Scanner_C.pdf |
