26 Jan 2010 A new range of enhancements to the Phenom dekstop Scanning Electron Microscope are now available to improve performance and extend measuring capability. The Charge Reduction Sample Holder reduces the pressure in the sample chamber & significantly reduces sample charging effects that can be seen on non-conductive samples.
The Micro Tool Holder is designed for imaging micro machined tools & parts. It can clamp tools with a dia. of 1-10mm & max length of 100mm & provides sample tilt of -10 to +45 deg & 90 deg rotation.
The Microelectronics Sample Holder features a unique clamping mechanism that ensures microelectronics can be mounted without the need for adhesives, providing fast & easy imaging.
The X-View Sample Holder is perfect for imaging x-sections of samples & uses a clamping mechanism that does away with the need for screws & is suitable for imaging thin coatings & paints, fractured surfaces & machined parts. | 
