16 Nov 2009 The QDI 2010 PV instrument is designed to measure the transmission and reflectance of photovoltaic cells of various types, be they traditional crystalline silicon, thin film or components thereof. This new CRAIC Technologies microspectrophotometer is now offered by Elliot Scientific to manufacturers and researchers in the UK and Ireland.
The QDI 2010 PV enables determination of thin film thickness in microscopic sampling areas from over 100 microns across to less than a micron on both transparent and opaque substrates. It also has a host of other functions and, in combination with CRAIC Technologies proprietary contamination imaging capabilities, it can locate and identify process contaminants.
Designed for the production environment, the QDI 2010 PV incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as sophisticated tools for analyzing data. |
