16 Jun 2009 Measures specular, diffuse, and retroflectance to determine total integrated scatter and surface RMS. True total hemispheric reflectance is also determined. Represents a substantial innovation in handheld portable instrumentation for determining surface scattering characteristics. The PLS 100 is a reflectometer that uses specular, diffuse, and tetroreflectance (backscatter) measures to determine total integrated scatter and surface is also determined. Any opaque surface finish from specular to Lambertian is measurable.
The measurement wavelength is determined by the choice of laser. Depending on available laser diode wavelengths, measurements from the ultraviolet to the near infrared are possible.
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