15 Jun 2009 Measures spectral IR total hemispherical reflectance, 2.5-25 microns (most surfaces). Integration of reflectance is used to calculate and display emittance. A unique instrument for easily and quickly measuring total hemispherical spectral reflectance of almost any surface regardless of size. The instrument makes measurements over the infrared region of the spectrum from 2.5um to 25um. The LPIR FT incorporates unique optical, mechanical, and electronic designs to provide state-of-the-art performance in a compact instrument. The LPIR FT is also available in a vacuum chamber compatible version; LPIR FT V.
The LPIR FT user interface provides a one button operation for an automatic measurement scan. For additional flexibility, selectable options for specific measurments are provided, including multiple scan averaging. |
