21 Sep 2009 Measures total hemispherical reflectance, <3 to >35 micrometers, and performs integrated total hemispheric reflectance measurement, 250 nm to 2500 nm. The TESA 2000, by virtue of an advanced optical system, is a powerful combination of two instruments in one package. The TESA 2000 provides in a single unit:
1) A portable reflectometer/emissometer that performs optically integrated total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength. Performs the same measurement as our TEMP 2000A, providing improved emittance determination performance and maintainability over the no longer produced Gier Dunkle DB-100 IR Reflectometer* and in accordance with the ASTM E408 standard.
2) A portable solar absorption/reflectometer that performs optically integrated total hemispheric reflectance measurement.
*AZ's TESA 2000 represents an excellent option for replacing a Gier Dunkle DB100 while adding options |
