09 Jun 2009 The AccuMap-SE® combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large panels. The broad spectral range is well suited to thin films in photovoltaic applications. Characterizing thin film uniformity of large panels just got easier. The AccuMap-SE® combines a high-speed
M-2000® spectroscopic ellipsometer with fast mapping for large panels. Gain confidence about your coatings
that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the
M-2000 (245-1690nm) is well suited to all thin films in photovoltaic and flat panel display applications.
Determine uniformity of film thickness and optical constants (n & k) for a wide range of coatings:
• Amorphous, Microcrystalline and Polycrystalline Silicon
• CIS/CIGS
• CdTe, CdS
• Low-ε Coatings on Glass
• Transparent Conductive Oxides(ITO, SnO2:F, AZO, ZnOx...)
• Polymer Films (polyimide, PEDOT, P3HT, PV2P,...)
• Single and Multiple Layer Coatings |
