05 Aug 2008 The Dektak 150 has been widely accepted as a superior solution for: measuring thin film thickness, stress and surface roughness ranging from semiconductor research to solar cell production. With a variety of configurations, the Dektak 150 offers application packages for everything from simple step height measurements to advanced automation with programmable X-Y positioning of wafers up to 150mm. The compact system accommodates samples up to 90 millimeters thick, performs long scans of 55 millimeters, and provides a larger X-Y translation than competing systems. |
