QDI FilmPro Thin Film Thickness Measurement

03 Jul 2008

Software to measure thickness of thin films by transmittance or reflectance.

Designed for use with CRAIC microspectrophotometers, QDI FilmPro measures the thickness of thin films by both transmittance and reflectance. This flexible software package works with many types of films and many types of substrates. Automation features mean that a CRAIC microspectrometer can be fully controlled via this software.