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Product Announcement

Si-APD with Integrated Filter at 905 nm

18 Jan 2008

LASER COMPONENTS offers a new APD with integrated filter, making this an ideal solution for rangefinding systems based on the time-of-flight method (LIDAR).

In the time-of-flight method, a 905 nm pulsed laser diode emits a laser pulse that reflects off an object and is focussed through an optic onto an APD chip. In order to achieve an optimal signal-to-noise ratio, an external band-pass filter that blocks the surrounding light has to be mounted in front of the APD or the optic. In the new SARF series, this filter comes already integrated into the TO housing. The 230 µm or 500 µm APD chip is also optimized for 905 nm to provide the best performance possible at this wavelength. The advantages are obvious: cost reduction (as external filters are no longer necessary and additional assembly steps are saved), smallest design, and optimal systems characteristics at the measurement wavelength 905 nm. We offer an APD filter solution in a modified TO-46 and as an SMD housing. Thanks to mass production this APD can be offered at extremely competitive prices.

CONTACT DETAILS
LASER COMPONENTS GmbH
Werner von Siemens Str. 15
Olching
82140
Germany
Tel: ++49 8142 28640
Fax: ++49 8142 286411
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