11 Sep 2008 KALEO measures simultaneously the aberrations, the focal length and the MTF of any optics and can characterize directly high NA optics without any relay lens. Based on the PHASICS wavefront sensing innovative technology (4-wave lateral shearing interferometry), KALEO gives a complete and precise lens characterization. It measures aberrations, MTF, PSF and the focal length of spherical and aspherical optics (photo objectives for mobile phones, IOLs etc) simultaneously.
The technology can characterize directly an optics with a numerical aperture up to 0.75 without any relay lens.
The main advantage of PHASICS innovative technology for optical metrology is the high resolution of the phase map (up to 300 x 400 measurement points) that allows a very precise characterization of the aberrations and the MTF of any optics.
Very compact and insensitive to vibrations, KALEO combines ergonomics and easy measurement process with a robust software. |
