13 Feb 2007 Photon's several models of NIST-traceable Near-Field Profilers cover a wide range of wavelengths and power levels. An important application of these instruments is to extend the focused laser spot size measurement range of the NanoScan profiler. NanoScan Near-Field Profiler
Measuring the near field of sources such as laser diodes, VCSELs, optical fiber, and/or waveguides can be a difficult task. Accurate measurement of such small sources to the micron level requires high precision in the optical and mechanical design. To simplify this task and to fill this requirement, Photon offers several models of Near-Field Profilers (NFPs) covering a wide range of wavelengths and power levels. Another important application of these instruments is to extend the focused laser spot size measurement range of the NanoScan profiler. By expanding the size of a focused spot it is possible to reduce the power density and make possible the measurement of beams that are too powerful to be measured without attenuation, as well as those that are too small to be accurately measured with the standard scan head. The NanoScan NFPs are easy-to-use turnkey systems that can be used either as a stand-alone instrument or integrated into manufacturing inspection systems.
For NanoScan users who want to extend the measurement capability of their present systems, the optical and mechanical components are also available as accessories.
The NFP-980 with 60:1 magnification and
1µm resolution, specifically designed for measurement of 980 nm pump lasers, is also ideal for other applications in the wavelength range between 700nm-1100 nm. The NFP-1550, with 40:1 magnification and 2.6µm resolution, is designed for use in characterizing sources in the 1300nm-1600nm telecommunications wave-length band. Both models come with a NanoScan GE/9/5 scan head and the magnifying objective rigidly mounted to a precision XYZ translation stage, in turn mounted to an optical rail. They also include the NanoScan Control and Data Acquisition Card and NanoScan Acquisition and Analysis Software. The system has all the standard Windows file saving, printing, communication and ActiveX capability.
For visible wavelengths, the NFP-VIS is equipped with the NanoScan SI/9/5 scan head and the 60:1 microscope objective, AR coated for the 400-700nm wavelength range. UV Wavelengths below 380nm can also be accommodated with an optional UV corrected microscope objective.
For higher power and longer wavelength beams the NFP-Pyro is available. These systems can measure spot sizes from 5μm at any wavelength from 190nm to 20μm. The NFP-Pyro is for beam powers up to 100W. This instrument configuration naturally reduces the power density incident on the instrument by one over the square of the magnification. The system comes with a lens for the user-specified wavelength of use.
For viewing VCSEL junctions, single-mode fibers and large long wavelength LD junctions there is an optional 100:1 objective lens option, producing diffraction limited performance from 400-700nm with a working distance of approximately 0.25-0.35mm and. Numerical Aperture is 0.90. From 700-1600nm, this lens produces near diffraction-limited performance.
Software Specifications
Powerful and flexible NanoScan software designed for Microsoft Windows:
*Integrated software package for Windows 2000 and XP Professional.
*Single and multibeam analysis.
*ActiveX automation server standard.
*12-bit PCI scan control and acquisition interface.
*Peak connect for pulsed beam measurement standard.
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