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Press Release

New Catalog on Planar Piezo AFM Scanners, Scanning Probe Microscope Scanners

Date Announced: 10 Mar 2011

PI (Physik Instrumente) L.P. – a leading manufacturer of piezo nanopositioning systems and scanners for microscopy, bio-medical and nanotechnology applications – has released a new catalog on planar piezo scanners for Atomic Force and Scanning Probe microscopy.

The new catalog covers a variety of novel closed-loop planar piezo scanners, and controllers with advanced digital features for higher scanning rates, improved linearity and responsiveness.

Compared to conventional piezo tube scanners, the low-bow, flexure guided piezo stages are run in closed-loop mode and provide significantly lower out of plane motion (flatness) and better linearity. A special stage designed with a new lead-free piezo material allows resolution down to 20 picometers and less than 1 nanometer hysteresis.

Flexure stages with travel ranges to 1800 microns are available and many different configurations from single axis to 6-axis systems are offered.

Self-locking ultrasonic motor stages with long travel ranges to 200mm are also available for pre-positioning, and as a stable base for the high-speed piezo scanners.

Contact

PI on Twitter: http://twitter.com/PI_Physik_Inst
PI Blog: http://physik-instrumente.blogspot.com/


International Contacts:


USA / Canada / Mexico: www.pi-usa.us

East: David Rego
Tel: (508) 832-3456
Email: info@pi-usa.us

Midwest Joe McGonagle
(508) 832-3456
Email: info@pi-usa.us


West David Steinberg
Tel: (949) 679-9191
Email: info@pi-usa.us




Europe: www.pi.ws

Germany: www.pi.de +49 (721) 4846-0
Italy: www.pionline.it +39 (02) 665 011 01
France: www.pifrance.fr +33 (1) 481 039 30
UK: www.physikinstrumente.co.uk +44 (1582) 764 334

Asia:
Japan: www.pi-japan.jp +81 (6) 6304 5605
China www.pi-china.cn +86 (21) 687 900 08


E-mail: info@pi-usa.us

Web Site: www.piezo.ws

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