Optics.org
daily coverage of the optics & photonics industry and the markets that it serves
Featured Showcases
Photonics West Showcase
Optics+Photonics Showcase
Press Releases
Menu
Press Release

From a microscope to a nanoscope (STED Microscopy)

Date Announced: 26 Nov 2014

In the conventional microscopy the limit in resolution is half of the wavelength of the light.  For blue light this would mean resolution of 200 nm is achieved. This resolution limit was postulated by Ernst Abbe and considered for decades as insurmountable. The reason is based on the diffraction, which occurs at two clearly differentiated objects and makes both objects appear blurred together into one. Using the Stimulate Demission Depletion Method (STED) developed by Dr. Stefan W. Hell.  This now allowed for a higher resolution that was far below the above mentioned limit. The microscope became a nanoscope and alters long-standing conceptions about the resolving powers in light microscopy.

In this method a cell is excited by a diffraction-limited laser source. Immediately this cell is then overlaid by another laser source. This second laser has a special feature where it has a hole in the middle, a so-called doughnut-shaped beam. The result is a prevention of the effective excitation of the cell, except in the focal spot that happens to be in the central area of the doughnut-shaped beam. The remaining spot can be reduced in the circumferences to achieve a higher resolution. Molecular processes can be inspected in vivo and can also be investigated and tracked in real time.

The scanning process inside the STED microscopy has to be very fast to meet these requirements. Piezoelectical stages, tilting systems and objective positioners are suitable instruments, which are necessary in the STED setup. The objective positioners of the series MIPOS, the mirror tilting system series PSH and the z-axis scanner PZ300AP CAP AP are great examples of the product range offered by piezosystem jena, that can be used for STED microscopy. These elements can be moved to predefine positions very fast with a high precision in the nanometer range.

The series MIPOS offers microscope objective positioners for standard and special objectives for all major microscope brands, Carl Zeiss, Nikon, Leica, Mittutoyo, just to mention a few. They can be used for single objectives and also for the complete revolver. The Series PSH with large tilting stages, mirrors and other optics can be tilted and positioned with frequencies in the kilohertz range.

With the PZ300 AP piezosystem jena offers another product developed for microscopy. Besides a very small overall height, the PZ300AP is also characterized by a very big aperture that accommodates standard microscopy accessories like incubators and multiwells sample holders. The stage has been designed to fit into Märzhauser and Prior XY-microscope standard stages.

All the stages can be controlled with piezosystem jena amplifiers. You will find one that meets your requirements within a wide range of products with a long variety of features, such as high current, integrated function generators, filters, triggering and interfaces.

For more information please visit us at: www.piezosystem.com 

Contact

piezosystem jena, Inc.

2B Rosenfeld Drive
Hopedale, MA 01747
USA

phone: +1 (508)634-6688
fax: +1 (508)634-6868
e-mail: usa(at)piezojena.com

E-mail: tkuntze@piezojena.com

Web Site: www.piezosystem.com

© 2024 SPIE Europe
Top of Page