PInano™ piezo scanning stages for highly accurate positioning of samples

Date Announced: 06 Oct 2010

Scanning stage designed for high-res optical microscopy.

Physik Instrumente’s (PI) technology is benefitting microscopy through the PInano™ low-profile (20 mm) piezo scanning stages. Designed for positioning samples in high-resolution optical microscopy, PInano’s P-545 XY or XYZ piezo-driven scanning and positioning stage provides travel ranges of up to 200 µm in two or three axes, with position resolution in the nanometer range. Integrated piezo ceramic PICMA® actuators offer maximum reliability with a proven superior lifetime. Featuring a large central aperture for transmitted light microscopy, PInano can accommodate holders for Petri dishes or standard object slides (25 x 75 mm), with additional accessories also available.

PInano’s integrated data recorder collects motion parameters, in addition to system parameters, and a wave generator controls the motion of the stage using diverse pre-set and user-defined motion profiles. The piezo controller is supplied with Windows® operating software, and with its extensive software support, comprehensive DLLs, LINUX and LabVIEW drivers are available for automated control. Additionally, the software supports a series of common image acquisition systems, such as µManager and MetaMorph®. A 24-bit resolution USB port, as well as ethernet, RS-232 and analog interfaces, is supplied as standard.

Complementing the P-545 stage is the M-545 manual XY open-frame microscopy stage. Fitting directly onto all common inverse light microscopes, this carries the piezo stage and allows sample movement along larger travel ranges. If required, the M-545 stage can also be equipped with stepper motor drives.

Source: Physik Instrumente

Contact

E-mail: stefanv@pi-usa.us

Web Site: www.piceramic.com