Industrial Tomography: Detecting hidden defects with microfocus X-ray sources

24 September 2026

This case study from Hamamatsu Photonics examines how microfocus X-ray sources support high-resolution industrial computed tomography (CT) for non-destructive testing. It explains how focal spot size, output power, and system integration affect inspection performance across batteries, composites, plastics, and semiconductors devices. It also outlines key trends shaping future industrial CT development and the role of advanced microfocus source technologies.