Advanced Spectral Technology
AST is a metrology solutions provider with a line of highly flexible system solutions that combine both high-precision and high performance within a fully integrated system platform providing the following advanced capabilities:
- Wafer & Die Level CD (Critical Dimension) Metrology
- MEMS & 3D Component Inspection
- Advanced Overlay Metrology
- VSCEL Aperture Metrology & Inspection
- Advanced Microelectronics Package Inspection
- Probe Card Inspection & Metrology
Categories
Autocollimators
Die-level testing systems
Frame grabbers
High-speed cameras
High-volume production lines
Image processing
Image processors
Imaging systems
Infrared sources
Infrared/thermal imaging
Interferometers
IR optics
Microscopy
Optical design services
Optical fabrication
Optical sensors
Optical testing equipment
Other cameras
Ultrafast measurement systems
Ultraviolet sources
UV optics
Wafer-level testing systems
