Aquila Instruments Limited

Advanced Thin FIlm Measurement Instruments. Measure thin film thickness, refractive index and absorption, transmittance and reflectance.Aquila manufacture a range of desktop thin film analysis systems for a wide range of applications. This includes characteristion of layer thickness, refractive index and absorption as well as the most precise measurement of transmission and reflection simultansously. The nkd series is the most advanced thin film analysis system available.