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Advanced Spectral Technology

About

AST is a metrology solutions provider with a line of highly flexible system solutions that combine both high-precision and high performance within a fully integrated system platform providing the following advanced capabilities:

- Wafer & Die Level CD (Critical Dimension) Metrology - MEMS & 3D Component Inspection - Advanced Overlay Metrology - VSCEL Aperture Metrology & Inspection - Advanced Microelectronics Package Inspection - Probe Card Inspection & Metrology

Contact Details

74 W Cochran St
Simi Valley, CA
US
93065

Tel: 805-527-7657

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