Optics.org
KO
KO
daily coverage of the optics & photonics industry and the markets that it serves
Featured Showcases
Photonics West Showcase
Optics+Photonics Showcase
Menu

(a)Schematic illustration of the microscope (not to scale).

(b)Scanning electron microscopy (SEM) images of (top) the off-axis zone plate and uncoated window region, where the dashed line indicates the extent of the "parent" zone plate, and (bottom) 40nm half-pitch outer zones of the objective zone plate.

Image credit: Fernando Brizuela

© 2024 SPIE Europe
Top of Page