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High-Speed, High-Resolution SWIR Imaging for Industrial Inspection – Meet the NSC2301 Line-Scan Sensor | |
16 Jun 2025
New Imaging Technologies (NIT) presents the NSC2301, a next-generation SWIR InGaAs line-scan sensor designed for fast, accurate inspection in demanding industrial environments, designed and manufactured by NIT in France. The NSC2301 delivers 2048 x 1 resolution with an 8 µm pixel pitch, providing high-definition line-scan imaging ideal for applications such as silicon wafer inspection, solar panel quality checks, hot glass process monitoring and waste sorting on conveyor belts.
Engineered for speed and precision, the NSC2301 supports line rates > 80 kHz at full 2048-pixel resolution, making it perfectly suited for real-time inspection in high-throughput production lines. The sensor includes configurable exposure times and supports both ITR (Integrate-Then-Read) and IWR (Integrate-While-Read) modes for optimal adaptability. With a readout noise <90e- in high gain mode and 3 selectable gain levels, the sensor offers an outstanding balance between high sensitivity and high dynamic range – essential for capturing subtle material differences in varying lighting conditions. In late summer, NIT will launch LiSaSWIR v2, a new smart line-scan camera built around the NSC2301. It will feature Smart CameraLink connectivity, delivering fast, reliable data transfer and simplified integration into existing systems. NSC2301 Key Features
With its French engineering and in-house manufacturing, the NSC2301 exemplifies NIT’s commitment to quality, performance, and industrial reliability.
Whether your focus is semiconductors, renewable energy, or industrial automation, the NSC2301 brings precision, reliability, and performance to your SWIR inspection systems. Stay tuned for the launch of LiSaSWIR v2 – the smart solution for High-performance SWIR line-scan imaging.
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| New Imaging Technologies |
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