22 Feb 2007 Veeco Instruments Inc. (Nasdaq: VECO), a leading supplier of instrumentation to the nanoscience community, today announced the launch of the new Dektak® 150 Surface Profiler for high-performance research and industrial metrology applications. The Dektak 150 delivers the highest repeatability and lowest noise
over the largest scanning range available for a stylus profiler, enabling Veeco’s customers to benefit from greater scan range and ease-of-use. After successful in-depth beta testing at the University of Arizona, the Dektak 150 is being released for customer purchase on
February 14 at the Materials Research Society’s Fall 2006 Conference, in Boston, Massachusetts.
“The Dektak 150 provides the performance and application flexibility we require for our cutting-edge research in the fields of optics and nanotechnology,” says Dr. Nasser Peyghambarian, Chair of Photonics and Lasers at the Optical Sciences Center, University of Arizona. “The surface profiler’s robust design and ease-of-use enables multiple users from our various research departments to quickly obtain the data they require on a wide range of applications.”
John Wissinger, Vice President of Veeco’s Optical/Industrial business commented, “We have capitalized on over three decades of Dektak product success to develop a 150-millimeter instrument that provides capabilities far beyond competing stylus profilers. Our beta customers were delighted with the products’ simple, one-button scanning, full automation and three-dimensional mapping. We expect that the Dektak 150’s combination of power and affordability advances will take the Dektak line into new applications in automotive, aerospace, semiconductor, textiles, and other industrial markets.”
The unique modular design of the Dektak 150 enables it to be configured to meet even the most stringent application requirements. The compact system accommodates samples up to 100 millimeters thick, performs long scans of 55 millimeters, and provides a larger X–Y translation than competing systems. The half-millimeter vertical range is the best standard Z performance in the industry, and a 1-millimeter option extends the vertical capabilities even further.
With subnanometer step-height repeatability, the Dektak 150 accurately measures step-heights for thin films below 10 nanometers thick, up to nearly one-millimeter thick-films.
About Veeco
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide, data storage, HBLED/wireless, semiconductor and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota.
Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/
To the extent that this news release discusses expectations about market conditions, market acceptance and future sales of Veeco’s products, Veeco’s future financial performance, future disclosures, or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the challenges of volatility in end market conditions and the cyclical nature of the data storage, semiconductor, HB-LED/wireless and scientific research markets, risks associated with integrating acquired businesses and the acceptance of new products by individual customers and by the marketplace and other factors discussed in the Business Description and Management’s Discussion and Analysis sections of Veeco’s Annual Report on Form 10-K for the year ended December 31, 2005, subsequent Quarterly Reports on Form 10-Q and current reports on Form 8-K. Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements. |
