LiSaSWIR 2048 v2: High-Resolution SWIR Line-Scan Camera for Industrial Inspection, OCT & Spectroscopy

The LiSaSWIR 2048 v2 from New Imaging Technologies (NIT), part of LYNRED, is a high-performance SWIR line-scan camera designed for demanding industrial inspection, OCT, and spectroscopy applications. Built around NIT’s advanced NSC2301 InGaAs sensor, it delivers a 2K resolution of 2048 × 1 pixels and is available with either 8 × 14 µm or 8 × 200 µm pixel pitch, offering exceptional flexibility for a wide range of imaging systems.

Engineered for high-throughput environments, the LiSaSWIR 2048 v2 achieves line rates exceeding 110 kHz, enabling precise imaging of fast-moving targets while maintaining outstanding image quality. Its ultra-low readout noise below 90 e⁻ provides excellent sensitivity, allowing detection of subtle material variations, hidden defects, and low-contrast features that are difficult to capture with conventional imaging technologies.

The camera is ideally suited for semiconductor and wafer inspection, solar panel quality control, sorting and industrial process monitoring, as well as advanced scientific and analytical applications. Its combination of high speed, low noise, and SWIR sensitivity makes it particularly effective for Optical Coherence Tomography (OCT) and spectroscopy systems, where signal quality and precision are critical for accurate measurements and analysis.

System integration is simplified through a CameraLink interface and GenICam compliance, ensuring compatibility with industry-standard software and hardware platforms. This allows machine builders, OEMs, and system integrators to accelerate development and deployment while benefiting from a reliable and scalable imaging solution.

Made in France, the LiSaSWIR 2048 v2 reflects NIT’s expertise in premium SWIR imaging technologies, delivering the performance required for next-generation industrial and scientific applications.

Discover the LiSaSWIR 2048 v2 at VISION Stuttgart 2026. Visit NIT at Booth #8C42 to meet our team and learn how our latest SWIR imaging solutions can enhance your inspection, OCT, and spectroscopy systems.

Key Features

• 2048 × 1 px SWIR line-scan resolution
• NSC2301 InGaAs sensor
• 8 × 14 µm or 8 × 200 µm pixel pitch options
• 110 kHz line rate
• <90 e⁻ readout noise
• CameraLink interface
• GenICam compliant
• Ideal for semiconductor, wafer, solar inspection, OCT, and spectroscopy

Made in France by NIT, part of LYNRED