Product details
Characterize Thin Films with New AccuMap-SE Spectroscopic Ellipsometer Jun 9, 2009
Company details
J.A. Woollam Co., Inc.
645 M Street
Suite 102
Lincoln
NE
68508
United States
Tel:
402-477-7501
Fax:
402-477-8214
The AccuMap-SE® combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large panels. The broad spectral range is well suited to thin films in photovoltaic applications.
Request infoCharacterizing thin film uniformity of large panels just got easier. The AccuMap-SE® combines a high-speed
M-2000® spectroscopic ellipsometer with fast mapping for large panels. Gain confidence about your coatings
that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the
M-2000 (245-1690nm) is well suited to all thin films in photovoltaic and flat panel display applications.
Determine uniformity of film thickness and optical constants (n & k) for a wide range of coatings:
• Amorphous, Microcrystalline and Polycrystalline Silicon
• CIS/CIGS
• CdTe, CdS
• Low-ε Coatings on Glass
• Transparent Conductive Oxides(ITO, SnO2:F, AZO, ZnOx...)
• Polymer Films (polyimide, PEDOT, P3HT, PV2P,...)
• Single and Multiple Layer Coatings
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