CSMA Surface Analysis Workshop

The Centre for Surface and Materials Analysis (CSMA) is pleased to announce the date of this year’s annual Surface Analysis Workshop, which will take place on Thursday 23 October at CSMA’s headquarters in Stoke-on-Trent (UK).

With a focus on a wide range of critical surface analysis techniques and their applications to industries including Medical Devices, Consumer Healthcare, Semiconductor Devices, Speciality Glass, and Displays and Optics, the key highlights of this year’s programme include:

• Free and confidential advice – delegates are invited to bring in their materials and samples for an unbiased opinion and face-to-face discussions with industry experts.

• Interactive demonstrations – performed using state-of-the-art equipment such as XPS (X-ray Photoelectron Spectroscopy), 3DP (3D Non-Contact Surface Profiling), ToFSIMS (Time of Flight Secondary Ion Mass Spectrometry) and DSIMS (Dynamic Secondary Ion Mass Spectrometry) depth profiling.

• Meet the Experts forum – CSMA scientists will be available throughout the day to offer advice and assistance on any surface analysis issues.

Delegates will also have the opportunity to attend presentations, including theory and case studies, on quantitative surface analysis and chemical state mapping, surface topography and layer thickness measurement, molecular imaging of surfaces, and elemental composition of sub-surface layers and interfaces. The workshop will highlight how these techniques can investigate issues such as cleanliness, adhesion and disbondments, coating composition and uniformity as well as routine quality control in production, development and processing.